Superidealist
Brilliant_Rock
- Joined
- Sep 10, 2003
- Messages
- 655
For those who are interested, Kazumi Okuda's quality measurement method (from a 1980 Japanese patent).
PURPOSE:
To make quality measurement sure by displaying pattern groups of the specific shapes in the field of observation of the specimen.
CONSTITUTION:
A transparent glass plate (1) displaying the pattern groups (2) each of the shape comprising drawing an inner circle of a diameter R and an outer circle having a diameter of 2^(½) R in concentrical circle form and smearing out the section between the inner and outer circles of each 45 degree portion of the arc to make observation easy is disposed below the eyepiece (7) in the lens-barrel (5) of a microscope. After correction of magnifications has been done, a jewel or the like (10) being the specimen is placed on a stage (9) and is observed from the direction where it is normally appreciated. Within the field of observation, the defect image in the jewel or the like (10) and the pattern groups (2) are simultaneously observed and the defect image is contrasted with the pattern of exactly the same size as that of the image, whereby the length of the defect image is judged. Thereby, the defects in the jewel or the like (10) may be displayed by correct numerical values as areas and the intended object may be achieved.
PURPOSE:
To make quality measurement sure by displaying pattern groups of the specific shapes in the field of observation of the specimen.
CONSTITUTION:
A transparent glass plate (1) displaying the pattern groups (2) each of the shape comprising drawing an inner circle of a diameter R and an outer circle having a diameter of 2^(½) R in concentrical circle form and smearing out the section between the inner and outer circles of each 45 degree portion of the arc to make observation easy is disposed below the eyepiece (7) in the lens-barrel (5) of a microscope. After correction of magnifications has been done, a jewel or the like (10) being the specimen is placed on a stage (9) and is observed from the direction where it is normally appreciated. Within the field of observation, the defect image in the jewel or the like (10) and the pattern groups (2) are simultaneously observed and the defect image is contrasted with the pattern of exactly the same size as that of the image, whereby the length of the defect image is judged. Thereby, the defects in the jewel or the like (10) may be displayed by correct numerical values as areas and the intended object may be achieved.
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